Location
Online
Event Website
https://hicss.hawaii.edu/
Start Date
3-1-2023 12:00 AM
End Date
7-1-2023 12:00 AM
Description
Fuzzy testing of integrated circuits is an established technique. Current approaches generate an approximately uniform random sample from a translation of the circuit to Boolean logic. These approaches have serious scalability issues, which become more pressing with the ever-increasing size of circuits. We propose using a base of binary decision diagrams to sample the translations as a soft computing approach. Uniformity is guaranteed by design and scalability is greatly improved. We test our approach against five other state-of-the-art tools and find our tool to outperform all of them, both in terms of performance and scalability.
Recommended Citation
Pinilla, Elena; Fernandez-Amoros, David; and Heradio, Ruben, "Circuit Testing Based on Fuzzy Sampling with BDD Bases" (2023). Hawaii International Conference on System Sciences 2023 (HICSS-56). 3.
https://aisel.aisnet.org/hicss-56/da/soft_computing/3
Circuit Testing Based on Fuzzy Sampling with BDD Bases
Online
Fuzzy testing of integrated circuits is an established technique. Current approaches generate an approximately uniform random sample from a translation of the circuit to Boolean logic. These approaches have serious scalability issues, which become more pressing with the ever-increasing size of circuits. We propose using a base of binary decision diagrams to sample the translations as a soft computing approach. Uniformity is guaranteed by design and scalability is greatly improved. We test our approach against five other state-of-the-art tools and find our tool to outperform all of them, both in terms of performance and scalability.
https://aisel.aisnet.org/hicss-56/da/soft_computing/3