Location
Grand Wailea, Hawaii
Event Website
https://hicss.hawaii.edu/
Start Date
8-1-2019 12:00 AM
End Date
11-1-2019 12:00 AM
Description
Existing application performance management (APM) solutions lack robust anomaly detection capabilities and root cause analysis techniques, that do not require manual efforts and domain knowledge. In this paper, we develop a density-based unsupervised machine learning model to detect anomalies within an enterprise application, based upon data from multiple APM systems. The research was conducted in collaboration with a European automotive company, using two months of live application data. We show that our model detects abnormal system behavior more reliably than a commonly used outlier detection technique and provides information for detecting root causes.
Multivariate Unsupervised Machine Learning for Anomaly Detection in Enterprise Applications
Grand Wailea, Hawaii
Existing application performance management (APM) solutions lack robust anomaly detection capabilities and root cause analysis techniques, that do not require manual efforts and domain knowledge. In this paper, we develop a density-based unsupervised machine learning model to detect anomalies within an enterprise application, based upon data from multiple APM systems. The research was conducted in collaboration with a European automotive company, using two months of live application data. We show that our model detects abnormal system behavior more reliably than a commonly used outlier detection technique and provides information for detecting root causes.
https://aisel.aisnet.org/hicss-52/os/data_management/3